- 产品型号 SN74LVTH18646APMG4
- 品牌 Texas Instruments
- RoHS Yes
- 描述 IC SCAN-TEST-DEV/XCVR 64-LQFP
- 分类 专业逻辑
- 库存 2183
技术参数
- Package / Case 64-LQFP
- Mounting Type Surface Mount
- Number of Bits 18
- Logic Type ABT Scan Test Device With Transceivers and Registers
- Operating Temperature -40°C ~ 85°C
- Supply Voltage 2.7V ~ 3.6V
- Supplier Device Package 64-LQFP (10x10)
- ECCN EAR99
- HTSUS 8542.39.0001
- Moisture Sensitivity Level (MSL) 2 (1 Year)
- REACH Status REACH Unaffected
- RoHS Status ROHS3 Compliant


