- Product Model SN74LVTH18646APM
- Brand Texas Instruments
- RoHS Yes
- Description IC SCAN-TEST-DEV/XCVR 64-LQFP
- Categories Специальность Логика
- In Stock 1805
Technical Details
- Package / Case 64-LQFP
- Mounting Type Surface Mount
- Number of Bits 18
- Logic Type ABT Scan Test Device With Transceivers and Registers
- Operating Temperature -40°C ~ 85°C
- Supply Voltage 2.7V ~ 3.6V
- Supplier Device Package 64-LQFP (10x10)
- ECCN EAR99
- HTSUS 8542.39.0001
- Moisture Sensitivity Level (MSL) 3 (168 Hours)
- REACH Status REACH Unaffected
- RoHS Status ROHS3 Compliant


